Hitachi Vortex-90EX SDD Silicon Drift Detector X-Ray Spectrometer EDS XRF

Description

BRAND NEW
Hitachi Vortex-90EX Silicon Drift Detector (
SDD)
for SEM/EDS, X-ray spectroscopy or XRF.
Tested working. Meets the resolution spec.
The detector can be used with an SEM for EDS or stand-alone for x-ray spectrometry or XRF.
Power supply included.
Manufacturer's page:
https://www.hitachi-hightech.com/hhs-us/product_detail/?pn=ana-vortex-90ex
Specifications:
Name
Silicon Drift X-Ray Detector Spectrometer
Type
Vortex®-90EX
Overview
Vortex®-90EX silicon drift X-ray detectors feature active areas between 30 mm
2
and 80 mm
2
. Vortex®-90EX detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They feature excellent energy resolution (<130 eV FWHM at Mn Kα is typical) and a high count rate capability. At a very short peaing time of 0.1 µs, an output count rate of 900 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with virtually very small loss in energy resolution and minimal peak shift with count rate. The Vortex®-90EX is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 2 minutes. The Vortex®-90EX X-ray spectroscopy systems include a detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor with PI-SPEC Software. The complete detector also contains a charge-sensitive preamplifier and temperature stabilization system, which eliminates concerns of varying ambient temperature.
Typical Applications
X-ray fluorescence (XRF) spectroscopy – both bulk and micro-fluorescence
Micro XRF (additional sizes available in near future)
X-ray diffraction (XRD)
Partical Induced X-ray Emission (PIXE)
Total Reflection X-ray Fluorescence (TXRF)
Synchrotron radiation applications
Process control
Features
Extended probe (90 mm)
Available in 30, 40, 50, 65, 70, 80 mm
2
Available in thickness of 0.5 and 1 mm
Superb energy resolution
Detector temperature stabilization
Additional sizes are available under special contracts
Small and compact package for minimum vibration
Digital pulse processor (DPP) with PI-SPEC Software
US Patent Number
6,455,858
7,129,501 B2
Specifications
Detector
Material – Silicon Active Area – 30-80 mm
2
– Thickness – 0.5 mm and 1 mm
Window
Material – Beryllium Thickness – 12.5 and 25 µm (alternatives available)
Energy Resolution (FWHM) @ 5.9 keV
@ 1.0 µs Peaking Time 124 eV - 138 eV
@ 0.5 µs Peaking Time 130 eV - 139 eV
@ 0.25 µs Peaking Time 135 eV - 148 eV
@ 0.1 µs Peaking Time 145 eV - 180 eV
Preamplifier
Type – Charge sensitive, 1.5 mV/keV Signal polarity – Positive Reset – Electrical, <1 µs duration Rise time – <100 ns
Cooling
Thermoelectric
Power Consumption
Nominal voltage – 110/230 V (switchable)
Power supply and detector – 40 W Maximum
Physical Specifications
Detector package weight – 950 g Length – 241 mm (90 mm probe)
Height×Width – 64 mm×64 mm Cable Standard Length – 3 m
Digital Pulse Processor (DPP)
PI-SPEC Software (PDF format, 181kBytes)
Digital Controls
Gain – 16-Bit DAC Peaking Time – 0.25 - 16 µs Preset Time – Up to 1717s
Data Output
Spectrum Size – 1024, 2048 or 4096 channels Channel Size – 10, 20 or 40 eV
Integral Non-linearity
0.1% of full-scale output
Deadtime Correction
Better than ± 0.5% accuracy from 0 to 120,000 cps at 4 µs peaking time
Software
PI-SPEC software
*
– Allows user to acquire, manipulate spectra. Pentium III or later with at least 64 MB memory and 30 MB available disk space.
VTXDLL package
*
– Dynamic-Link Library to facilitate host software communication with the DPP. Pentium III or later with at least 64 MB memory and 30 MB available disk space.
* Requires a standard USB2.0 port